Optical heterodyne grating shearing interferometry for long-range positioning applications

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题名:	Optical heterodyne grating shearing interferometry for long-range positioning applications
作者:	Lee,JY;Lu,MP
贡献者:	光機電研究所
关键词:	DISPLACEMENT MEASUREMENT;RONCHI TEST;ACCURACY;TECHNOLOGY;INPLANE;SYSTEM
日期:	2011
上传时间:	2012-03-27 16:27:14 (UTC+8)
出版者:	國立中央大學
摘要:	We develop a displacement measurement and positioning system with nanometer resolution over the millimeter traveling range The method is based on a heterodyne grating shearing interferometry a homemade lock-in amplifier and a servo control loop for displacement sensing and positioning The quasi-common optical path configuration of our system provides better immunity against environmental disturbances The experimental results demonstrate that our system can measure small and long displacement with nanometric resolution The device achieves a positioning resolution of 23 nm over a traveling range of 20 mm (C) 2010 Elsevier BV All rights reserved
關聯:	OPTICS COMMUNICATIONS
显示于类别:	[光機電工程研究所 ] 期刊論文

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